发明名称 SYSTEM AND METHOD FOR ANALYZING WAVEFRONT ABERRATIONS
摘要 A method of creating a statistical model for use in predicting vision correction prescriptions for patients is disclosed. The method comprises obtaining a plurality of wavefront aberration measurements from a plurality of patient's eyes, obtaining a plurality of visual acuity measurements from the plurality of patients, applying values associated with the plurality of wavefront measurements to an input layer of a statistical model, applying values associated with the plurality of visual acuity measurements to an output layer of the statistical model, and generating a plurality of weight values associated with respective nodes of the statistical model based on the applied values associated with the plurality of wavefront measurements and corresponding values associated with the plurality of visual acuity measurements.
申请公布号 US2011255053(A1) 申请公布日期 2011.10.20
申请号 US201113099190 申请日期 2011.05.02
申请人 OPHTHONIX, INC. 发明人 DREHER ANDREAS W.;LAI SHUI T.
分类号 A61B3/10;A61B3/00;A61F2/16;B24B13/00;B29D11/00;G02C13/00 主分类号 A61B3/10
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