发明名称 Separate layer formation in a semiconductor device
摘要 A semiconductor device is formed. A first gate dielectric layer is formed over the semiconductor layer. A first conductive layer is formed over the first gate dielectric. A first separation layer is formed over the first conductive layer. A trench is formed in the semiconductor layer to separate the first mesa and the second mesa. The trench is filled with an isolation material to a height above a top surface of the first conductive layer. The first conductive layer is removed from the second mesa. A second conductive layer is formed over the first separation layer of the first mesa and over the second mesa. A planarizing etch removes the second conductive layer from over the first mesa. A first transistor of a first type is formed in the first mesa, and a second transistor of a second type is formed in the second mesa.
申请公布号 US8039339(B2) 申请公布日期 2011.10.18
申请号 US20070738683 申请日期 2007.04.23
申请人 FREESCALE SEMICONDUCTOR, INC. 发明人 GRANT JOHN M.;SAMAVEDAM SRIKANTH B.;VENKATESAN SURESH
分类号 H01L21/8238 主分类号 H01L21/8238
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