发明名称 Method of thermally treating silicon with oxygen
摘要 A method and apparatus for oxidizing materials used in semiconductor integrated circuits, for example, for oxidizing silicon to form a dielectric gate. An ozonator is capable of producing a stream of least 70% ozone. The ozone passes into an RTP chamber through a water-cooled injector projecting into the chamber. Other gases such as hydrogen to increase oxidation rate, diluent gas such as nitrogen or O2, enter the chamber through another inlet. The chamber is maintained at a low pressure below 20 Torr and the substrate is advantageously maintained at a temperature less than 800° C. Alternatively, the oxidation may be performed in an LPCVD chamber including a pedestal heater and a showerhead gas injector in opposition to the pedestal.
申请公布号 US2011250764(A1) 申请公布日期 2011.10.13
申请号 US201113165502 申请日期 2011.06.21
申请人 APPLIED MATERIALS, INC. 发明人 YOKOTA YOSHITAKA;RAMAMURTHY SUNDAR;ACHUTHARAMAN VEDAPURAM;CZARNIK CORY;BEHDJAT MEHRAN;OLSEN CHRISTOPHER
分类号 H01L21/316 主分类号 H01L21/316
代理机构 代理人
主权项
地址