发明名称 Dual Gate LDMOS Device with Reduced Capacitance
摘要 A transistor includes an n-well implanted in a substrate, a source region including a p-body region in the n-well, and a n+ region and a p+ region in the p-body region, a drain region including a n+ region, and a dual gate between the source region and the drain region. The dual gate includes a first gate on a side closer to the source region and a second gate on a side closer to the drain region, the first gate separated from the second gate by a pre-determined distance sufficient that a capacitance between the gate and the drain is at least 15% lower than a capacitance of a transistor of the same unit cell size and configuration excepting that the first gate and second gate abut.
申请公布号 US2011241113(A1) 申请公布日期 2011.10.06
申请号 US20100752077 申请日期 2010.03.31
申请人 ZUNIGA MARCO A 发明人 ZUNIGA MARCO A.
分类号 H01L29/78 主分类号 H01L29/78
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