发明名称 ELECTRONIC DEVICE WAFER LEVEL SCALE PACKAGES AND FABRICATION METHODS THEREOF
摘要 Electronic device wafer level scale packages and fabrication methods thereof A semiconductor wafer with a plurality of electronic devices formed thereon is provided. The semiconductor wafer is bonded with a supporting substrate. The back of the semiconductor substrate is thinned. A first trench is formed by etching the semiconductor exposing an inter-layered dielectric layer. An insulating layer is conformably deposited on the back of the semiconductor substrate. The insulating layer on the bottom of the first trench is removed to create a second trench. The insulating layer and the ILD layer are sequentially removed exposing part of a pair of contact pads. A conductive layer is conformably formed on the back of the semiconductor. After the conductive layer is patterned, the conductive layer and the contact pads construct an S-shaped connection. Next, an exterior connection and terminal contact pads are subsequently formed.
申请公布号 US2011237018(A1) 申请公布日期 2011.09.29
申请号 US201113152891 申请日期 2011.06.03
申请人 LIU CHIEN-HUNG;LEE SIH-DIAN 发明人 LIU CHIEN-HUNG;LEE SIH-DIAN
分类号 H01L31/02;H01L21/18;H01L21/78 主分类号 H01L31/02
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