发明名称 METHOD OF FORMING A REGION OF GRADED DOPING CONCENTRATION IN A SEMICONDUCTOR DEVICE AND RELATED APPARATUS
摘要 A method for forming a doped region of a semiconductor device includes masking a portion of a substrate with a mask. The mask is configured to create a graded doping profile within the doped region. The method also includes performing an implant using the mask to create doped areas and undoped areas in the substrate. The method further includes diffusing the doped areas to create the graded doping profile in the doped region. The mask could include a first region having openings distributed throughout a photo-resist material, where the openings vary in size and spacing. The mask could also include a second region having blocks of photo-resist material distributed throughout an open region, where the photo-resist blocks vary in size and spacing. Diffusing the doped areas could include applying a high temperature anneal to smooth the doped and undoped areas to produce a linearly graded doping profile.
申请公布号 US2011233670(A1) 申请公布日期 2011.09.29
申请号 US201113156184 申请日期 2011.06.08
申请人 NATIONAL SEMICONDUCTOR CORPORATION 发明人 FRENCH WILLIAM;MAZOTTI ERIKA;MIRGORODSKI YURI
分类号 H01L29/78 主分类号 H01L29/78
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