发明名称 Method and apparatus for verifying two dimensional mark quality
摘要 A method and system for applying a two dimensional mark on a first surface of a component and assessing mark quality, the method comprising the steps of positioning a component with a first surface at a first station, applying a two dimensional mark to the first surface at the first station wherein the applied mark is intended to codify a first information subset, obtaining an image of the applied two dimensional mark at the first station, performing a mark quality assessment on the obtained image and performing a secondary function as a result of the mark quality assessment.
申请公布号 US8027802(B1) 申请公布日期 2011.09.27
申请号 US20070743193 申请日期 2007.05.02
申请人 COGNEX CORPORATION 发明人 NADABAR SATEESHA;GOPALAKRISHNAN VENKAT;GERST CARL W.
分类号 G06F19/00 主分类号 G06F19/00
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