发明名称 MANUFACTURING METHOD FOR SEMICONDUCTOR DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a thermosetting adhesive composition which shows a superior solder cracking resistance when subjected to a high temperature solder reflow process at a temperature of about 260°C that is carried out for lead-free soldering, and also to provide a semiconductor package using the thermosetting adhesive composition. <P>SOLUTION: A manufacturing method for a semiconductor device has steps of: bonding a resin support made by impregnating a fibrous support base material with a thermosetting resin to a semiconductor element by using a thermosetting adhesive composition under a given heating condition A; sealing the support and semiconductor element bonded together in the previous step by using a sealing resin composition under a given heating condition B; and subjecting the sealed support and semiconductor element to heat treatment. The amount of warpage 1 of the thermosetting adhesive composition determined by a given warpage evaluation test satisfies a given conditional expression. <P>COPYRIGHT: (C)2011,JPO&INPIT</p>
申请公布号 JP2011187476(A) 申请公布日期 2011.09.22
申请号 JP20100047901 申请日期 2010.03.04
申请人 SUMITOMO BAKELITE CO LTD 发明人 MURAYAMA RYUICHI;KANAMORI NAOYA;MAKIHARA KOJI
分类号 H01L21/52;H01L21/56 主分类号 H01L21/52
代理机构 代理人
主权项
地址