发明名称 ELECTRON-BEAM EXPOSURE METHOD AND ELECTRON-BEAM EXPOSURE DEVICE
摘要 <p>In the disclosed method, when rotating and moving a substrate having a light-sensitive film formed thereon and using an electron beam to expose the light-sensitive film, the effective region of the light-sensitive film is divided, in the radial direction of the substrate, into a first region, a second region that is adjacent to and further towards the outside edge of the substrate than the first region, and a third region that is adjacent to and further towards the outside edge of the substrate than the second region. While exposing the second region, the rotational speed of the substrate is changed such that the linear velocity of the substrate through the point being irradiated by the electron beam is constant. While exposing the first region and also while exposing the third region, the rotational speed of the substrate is changed such that the linear velocity of the substrate is slower than the linear velocity used for the second region.</p>
申请公布号 WO2011115139(A1) 申请公布日期 2011.09.22
申请号 WO2011JP56112 申请日期 2011.03.15
申请人 HOYA CORPORATION;YAMASHITA HIROSHI 发明人 YAMASHITA HIROSHI
分类号 G03F7/20;G11B5/84;H01L21/027 主分类号 G03F7/20
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