发明名称 Semiconductor device with a trench gate structure and method for the production thereof
摘要 A semiconductor device with a trench gate structure includes a semiconductor body with switching electrodes. At least gate electrode controls the off state and the on state between the switching electrodes. The at least one gate electrode in the trench gate structure controls at least one vertical switching channel through at least one body zone. The trench gate structure includes at least one trench with side walls, wherein the at least one gate electrode, which is insulated against the side walls in the region of the at least one body zone alternately by at least one gate oxide section and at least one trench oxide section and forms a switching channel with a gate oxide section in the at least one region, is located in the at least one trench.
申请公布号 US8022470(B2) 申请公布日期 2011.09.20
申请号 US20080204665 申请日期 2008.09.04
申请人 INFINEON TECHNOLOGIES AUSTRIA AG 发明人 HIRLER FRANZ
分类号 H01L29/78 主分类号 H01L29/78
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