发明名称 Package failure prognostic structure and method
摘要 In accordance with one embodiment, a failure prognostic package includes a substrate having a first surface and an opposite second surface. An electronic component trace is coupled to the first surface. An electronic component is electrically coupled to the electronic component trace. A prognostic trace is coupled to the first surface of the substrate and is electrically isolated from the electronic component. A failure zone of the failure prognostic package includes a plurality of sides and a plurality of corners, wherein the prognostic trace is weaker at the failure zone than the electronic component trace. Failure of the prognostic trace does not cause failure of the failure prognostic package. However, failure of the prognostic trace provides advanced notice of failure of the failure prognostic package.
申请公布号 US8022521(B1) 申请公布日期 2011.09.20
申请号 US20080269357 申请日期 2008.11.12
申请人 AMKOR TECHNOLOGY, INC. 发明人 YOSHIDA AKITO;DREIZA MAHMOUD
分类号 H01L23/02 主分类号 H01L23/02
代理机构 代理人
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