发明名称 ESD PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE EQUIPPED WITH THE SAME
摘要 PROBLEM TO BE SOLVED: To provide an ESD protection circuit which has an ESD protecting function for respective circuits from a low breakdown voltage circuit to a high breakdown voltage circuit, and is attained with small layout area. SOLUTION: The ESD protection circuit includes an ESD protecting element 13 between a node NL connected to a power supply terminal VCC_l for outputting a low voltage and a ground line, an ESD protecting circuit 12 between a node NM connected to a power supply terminal VCC_m for outputting an intermediate voltage and a node NL, and an ESD protecting circuit 11 between a node NH connected to a power supply terminal VCC_h for outputting a high voltage and the node NM. An element 18 to be protected which has a low breakdown voltage, an element 17 to be protected which has an intermediate breakdown voltage, and an element 16 to be protected which has a high breakdown voltage are connected between the ground line VSS, and the nodes NL, NM and NH. The ESD protecting circuits 11, 12 and 13 perform ESD protection for the element 16 to be protected, the ESD protecting circuits 12 and 13 perform ESD protection for the element 17 to be protected, and the ESD protecting circuits 13 performs ESD protection for the element 18 to be protected. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011181848(A) 申请公布日期 2011.09.15
申请号 JP20100047122 申请日期 2010.03.03
申请人 SHARP CORP 发明人 FUKUMI KIMITAKA
分类号 H01L27/04;H01L21/822;H01L21/8234;H01L27/06;H01L27/088 主分类号 H01L27/04
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