SURFACE-PLASMON-ENHANCED FLUORESCENCE MEASUREMENT DEVICE AND CHIP STRUCTURE

摘要

Disclosed is a surface-plasmon-enhanced fluorescence measurement device, in which one surface of a metal thin film (102) that is arranged on a chip structure (108) is irradiated with excited light to enhance the electric field on the metal thin film (102), thereby exciting a fluorescent substance in a reaction field that is formed on the other surface of the metal thin film (102), and the enhanced fluorescence is detected by means of a light detection means. In the device, a light-blocking part (103) capable of blocking light having the same wavelength as that of the fluorescence excited from the fluorescent substance is arranged on one surface or other surface of the metal thin film (102) in the chip structure (108). In this manner, noises caused by scattered light or intrinsic fluorescence can be reduced, and therefore an S/N ratio can be improved.