发明名称 Optical system for a particle analyzer and particle analyzer using same
摘要 A compact optical system for a particle analyzer and particle analyzer using same are provided. The optical system for a particle analyzer of the present invention comprises a light source, an irradiation optical system for irradiating particles passing through a flow cell with light from the light source, a photodetector for receiving the scattered light from the particles, a light shielding member for blocking the direct light from the light source from impinging the photodetector, and a detecting lens for directing the scattered light toward the photodetector, wherein the irradiation optical system forms a first focus that focuses the light from the light source on the particle passing through the flow cell, and forms a second focus that focuses the light from the light source at a position between the detecting lens and photodetector, and disposes the light shielding member at the position of the second focus.
申请公布号 US8018592(B2) 申请公布日期 2011.09.13
申请号 US20100720201 申请日期 2010.03.09
申请人 SYSMEX CORPORATION 发明人 TABATA SEIICHIRO
分类号 G01N21/00;G01N33/48 主分类号 G01N21/00
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