发明名称 Compensation of degradation of performance of semiconductor devices by clock duty cycle adaptation
摘要 The device degradation of integrated circuits may be compensated for by appropriately adapting the duty cycle of the clock signal. For this purpose, a correlation between the duty cycle and the overall performance characteristics of the integrated circuit may be established and may be used during the normal field operation of the device in order to modify the duty cycle. Hence, an efficient control strategy may be implemented since the duty cycle may be efficiently controlled, while at the same time a change of clock signal frequency and/or an increase of supply voltage may not be required.
申请公布号 US8018260(B2) 申请公布日期 2011.09.13
申请号 US20090604532 申请日期 2009.10.23
申请人 ADVANCED MICRO DEVICES, INC. 发明人 PAPAGEORGIOU VASSILIOS;WIATR MACIEJ;HOENTSCHEL JAN
分类号 H03K5/14 主分类号 H03K5/14
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