METHOD AND DEVICE FOR CHECKING AN ELECTRONIC DEVICE

摘要

The invention relates to a method and device for checking an electronic device for determining at least one parameter of the system, wherein the method comprises the steps of: a) determining an expected minimum and/or maximum value of the parameter; b) acquiring the parameter of the system and generating an electrical signal by the electronic device as a function of the acquired parameter; c) determining at least one value (x, y) of a characteristic parameter (X, Y) of the generated electrical signal; d) setting an expected minimum and/or maximum value of the characteristic parameter (X, Y) as a function of the determined minimum and/or maximum value of the parameter of the system; e) checking whether the determined value of the characteristic value (X, Y) is greater than the minimum value set for the characteristic parameter and/or is less than the maximum value; f) determining whether a fault is present in the electronic device using the result from step e).