APPARATUS AND METHOD FOR TESTING SEMICONDUCTOR INTEGRATED CIRCUITS, AND A NON-TRANSITORY COMPUTER-READABLE MEDIUM HAVING A SEMICONDUCTOR INTEGRATED CIRCUIT TESTING PROGRAM

摘要

An apparatus for testing a semiconductor integrated circuit includes a pattern data generating unit configured to generate test pattern data for testing a write operation in a memory of the semiconductor integrated circuit; and a write unit configured to write the test pattern data into a storage area of the semiconductor integrated circuit.