发明名称 Supercritical fluid-assisted direct write for printing integrated circuits
摘要 High resolution patterns provided on a surface of a semiconductor substrate and methods of direct printing of such high resolution patterns are disclosed. The high resolution patterns may have dimensions less than 0.1 micron and are formed by a direct writing method employing a supercritical fluid comprising nanometer-sized particles, which may be optionally electrically charged.
申请公布号 US8011296(B2) 申请公布日期 2011.09.06
申请号 US20080232913 申请日期 2008.09.25
申请人 MICRON TECHNOLOGY, INC. 发明人 SANDHU GURTEJ;BASCERI CEM
分类号 B41L27/00 主分类号 B41L27/00
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