发明名称 TESTING METHOD, TESTING APPARATUS AND PROGRAM
摘要 PROBLEM TO BE SOLVED: To provide a technique that enables many ways of testing out test items prepared in advance. SOLUTION: A testing apparatus 1 receives the input of a sample scenario 2, in which a plurality of command blocks 20 each consisting of a command element 21 and a data element 22 and regarding the operation of a device to be tested are described. The testing apparatus performs at least one among a description order switching process, a command block inserting process, a command block replacing process, a command element changing process, or a through-process on the sample scenario 2 for creating a test scenario 5 in which the plurality of command blocks 20 are described, in accordance with the order of testing; and also, each of the command blocks 20, described in the test scenario 5, is transmitted to the device to be tested, in either a default-speed transmission mode, a random-speed transmission mode, a pose insertion transmission mode, or a variable-speed transmission mode in accordance with the order of description in the test scenario 5. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011170643(A) 申请公布日期 2011.09.01
申请号 JP20100034119 申请日期 2010.02.18
申请人 NAKAYO TELECOMMUN INC 发明人 SHIROTA SHOHEI
分类号 G06F11/28 主分类号 G06F11/28
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