| 摘要 |
PROBLEM TO BE SOLVED: To provide a PDL-measuring instrument and a PDL measurement method for correctly measuring a PDL of a to-be-measured system which includes ALC function for each wavelength. SOLUTION: The PDL-measuring instrument for measuring the PDL of the system 10 to be measured, including the ALC function includes n light sources 11-n (n is an integer of 2 or more) for outputting linear polarization measurement lights at different wavelengths; a polarization multiplexer 13 for inputting the measurement lights output from the n light sources 11-n at n wavelengths, and multiplexing polarizations in a state that an interval between the linear polarizations of (360/2n)° is maintained; a polarization scrambler 14 for changing the polarization multiplex signal output from the polarization multiplexer 13 to a randomly polarized state, and inputting it to the system to be measured; an optical filter 17 for inputting an output light from the system to be measured, selecting one wavelength from among the n wavelengths, and outputting it; and a PDL meter 16 for detecting an output optical power from the optical filter 17, and measuring the difference between the maximum value and the minimum value as the PDL of the system to be measured and the optical filter. COPYRIGHT: (C)2011,JPO&INPIT
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