发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 In a transistor including an oxide semiconductor layer, an oxide insulating layer is formed so as to be in contact with the oxide semiconductor layer. Then, oxygen is introduced (added) to the oxide semiconductor layer through the oxide insulating layer, and heat treatment is performed. Through these steps of oxygen introduction and heat treatment, impurities such as hydrogen, moisture, a hydroxyl group, or hydride are intentionally removed from the oxide semiconductor layer, so that the oxide semiconductor layer is highly purified.
申请公布号 US2011212569(A1) 申请公布日期 2011.09.01
申请号 US201113029148 申请日期 2011.02.17
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;KOEZUKA JUNICHI
分类号 H01L21/16 主分类号 H01L21/16
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