发明名称 |
Substrate for a display panel, and a display panel having the same |
摘要 |
A substrate for a display panel includes an alignment accuracy measurement mark which is used for measuring alignment accuracy between patterns on the substrate without decreasing an aperture ratio of a pixel. The substrate for a display panel includes the alignment accuracy measurement mark in an isolated configuration which is used for measuring alignment accuracy between a pattern of a gate signal line and an auxiliary capacitance line and a pattern of a source signal line and a drain line, where the alignment accuracy measurement mark has a shape such that at least one straight line portion is included, is formed in a layer where the pattern of the source signal line and the drain line is formed, and is positioned on the gate signal line.
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申请公布号 |
US8008789(B2) |
申请公布日期 |
2011.08.30 |
申请号 |
US20100981699 |
申请日期 |
2010.12.30 |
申请人 |
SHARP KABUSHIKI KAISHA |
发明人 |
NODA TOMOKI;TAKEUCHI MASANORI;ENDA KENJI |
分类号 |
H01L23/544;H01L21/76;H01L29/04;H01L31/00 |
主分类号 |
H01L23/544 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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