| 摘要 |
FIELD: physics. ^ SUBSTANCE: direction in which residual stress will be determined is selected on the surface of the inspected article, as well as crystallographic planes exposed to X-rays. The diffraction pattern is recorded. Angular positions of reflexes are determined, from the mutual alignment of which residual stress is determined. The method is characterised by that in order to determine residual stress in the selected direction and the direction perpendicular to the selected direction, crystallographic surfaces are used, reflexes from which lie in a precise region and normal projections to the surface of the inspected article of which have minimum angle of deviation from the selected direction. Further, the selected planes are successively brought into a reflecting position by turning and tilting the sample. The inspected article is exposed to an X-ray beam. Reflexes from the selected planes are recorded. The reflexes are processed in order to determine angular positions. True lattice constants of each of the phases which are not distorted by residual stress and then residual stress are determined using corresponding mathematical expressions. ^ EFFECT: high accuracy of determining residual stress. ^ 2 cl, 4 dwg |
