发明名称 GLASS FOR SEMICONDUCTOR COATING AND MATERIAL FOR SEMICONDUCTOR COATING USING THE SAME
摘要 <p>Provided is a glass for semiconductor coating that causes little environmental stress and has a high surface charge density after semiconductor surface coating. The glass for semiconductor coating is either the following (1) or (2). The glass for semiconductor coating (2) causes little environmental stress, has a high surface charge density after semiconductor surface coating, and has excellent chemical resistance. The glass for semiconductor coating (1) is essentially lead-free and contains a composition comprising, by mass%, 50% to 65% ZnO, 19% to 28% B2O3, 7% to 15% SiO2, 3% to 12% Al2O3, and 0.1% to 5% Bi2O3, while the glass for semiconductor coating (2) is essentially lead-free and contains a composition comprising, by mass%, 40% to 60% ZnO, 5% to 25% B2O3, 15% to 35% SiO2, and 3% to 12% Al2O3.</p>
申请公布号 WO2011093177(A1) 申请公布日期 2011.08.04
申请号 WO2011JP50808 申请日期 2011.01.19
申请人 NIPPON ELECTRIC GLASS CO., LTD.;NISHIKAWA YOSHIKATSU 发明人 NISHIKAWA YOSHIKATSU
分类号 C03C8/04;C03C8/14;C03C8/20;H01L21/316 主分类号 C03C8/04
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