发明名称 LITHOGRAPHIC APPARATUS AND DEVICE MANUFACTURING METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a lithographic process where a process error caused by one or more heat sources can be reduced or minimized. <P>SOLUTION: An immersion lithographic apparatus is provided. The immersion lithographic apparatus has a substrate table including a drain so configured as to receive an immersion liquid leaking into a gap between the edge of a substrate on the substrate table and the edge of a concave portion where the substrate is disposed. By directing one or more jets of the liquid toward the back side of a portion that supports the substrate, at least a portion of the concave portion that supports the substrate is thermally adjusted, thus providing a thermal adjustment system in the immersion lithographic apparatus. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011151397(A) 申请公布日期 2011.08.04
申请号 JP20110009381 申请日期 2011.01.20
申请人 ASML NETHERLANDS BV 发明人 PATEL HRISHIKESH;JACOBS JOHANNES HENRICUS WILHELMUS;KUSTERS GERARDUS ADRIANUS ANTONIUS MARIA;LAURENT THIBAULT SIMON MATHIEU;MIRANDA MARCIO ALEXANDRE CANO;BLOKS RUUD HENDRICUS MARTINUS JOHANNES;FENG PENG;KUNNEN JOHAN GERTRUDIS CORNELIS
分类号 H01L21/027 主分类号 H01L21/027
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