发明名称 METHOD FOR DIVIDING SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide a division method of a substrate, capable of making a chip profile approximating a rectangle with improved reproducibility for dividing the substrate without chip breakage, and of forming a flat cleavage surface with improved reproducibility. SOLUTION: A substrate surface 2 is irradiated with an electron beam 1 and has intensity for generating dislocation inside the substrate, and a range that is longer than the depth from the substrate surface 2 at the interface of two parts having different temperatures, in which a crystal defect begins to be generated in the depthwise direction of the substrate; and cracks with dislocation as a starting point are generated and form a cleavage plane 5, and the substrate is divided. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011146748(A) 申请公布日期 2011.07.28
申请号 JP20110102314 申请日期 2011.04.28
申请人 PANASONIC CORP 发明人 UEDA TETSUZO;UEDA DAISUKE
分类号 H01L21/301;H01L21/304;H01L21/78;H01L33/00;H01S5/02;H01S5/343 主分类号 H01L21/301
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