发明名称 GENDER FOR TESTING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A test gender of a semiconductor is provided to connect various sizes of a solid state drive to a test device. CONSTITUTION: A connector(110) is connected to a semiconductor device and a test device. A head unit(120) fixes the connector. A body unit(130) fixes the head unit. The body unit accepts the semiconductor device. A guide unit fixes the semiconductor in the body unit by inserting the body unit.
申请公布号 KR20110085477(A) 申请公布日期 2011.07.27
申请号 KR20100005290 申请日期 2010.01.20
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 SHIN, JOUNG HEE;CHANG, SUNG HO;PARK, BYEONG DAE
分类号 H01R12/71;H01R33/76 主分类号 H01R12/71
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