发明名称 Charged particle spin polarimeter, microscope, and photoelectron spectroscope
摘要 A charged particle spin polarimeter that is capable of resolving with high efficiency the magnetic moment of a charged particle. The charged particle spin polarimeter has a pair of convex and concave magnetic poles to apply a magnetic field with gradient to an incident charged particle and a pair of plain plate electrodes to apply, to a charged particle, an electric field for canceling a Lorentz force that the charged particle receives from the magnetic field. The magnetic moment in the magnetic field direction of a charged particle is resolved by the interaction between the gradient of the magnetic field and the magnetic moment of the charged particle.
申请公布号 US7985952(B2) 申请公布日期 2011.07.26
申请号 US20080028996 申请日期 2008.02.11
申请人 HITACHI, LTD. 发明人 KOHASHI TERUO
分类号 G01N23/00 主分类号 G01N23/00
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