发明名称 |
Method for testing nonlinearity error of high speed digital-to-analog converter |
摘要 |
A novel method applies the down-conversion sampling technology to test a high-speed digital-to-analog conversion. In the method, a digital-to-analog conversion output signal of a high-speed digital-to-analog converter and a low-frequency sinusoidal carrier wave signal input to a comparator to obtain a low-speed pulse signal. Therefore, the variation of the pulse width of the low-speed pulse signal can be measured by a common logic analyzer to assess the nonlinearity error of the high-speed digital-to-analog converter.
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申请公布号 |
US7982642(B1) |
申请公布日期 |
2011.07.19 |
申请号 |
US20100684364 |
申请日期 |
2010.01.08 |
申请人 |
NATIONAL YUNLIN UNIVERSITY OF SCIENCE AND TECHNOLOGY |
发明人 |
LIN CHUN-WEI;LIN SHENG-FENG |
分类号 |
H03M1/10 |
主分类号 |
H03M1/10 |
代理机构 |
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代理人 |
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地址 |
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