发明名称 Manufacturing method of thin film transistor including low resistance conductive thin films
摘要 A manufacturing method of a thin film transistor includes forming a pair of source/drain electrodes on a substrate, such that the source/drain electrodes define a gap therebetween; forming low resistance conductive thin films, which define a gap therebetween, on the source/drain electrodes; and forming an oxide semiconductor thin film layer on upper surface of the low resistance conductive thin films and in the gap defined between the low resistance conductive thin films so that the oxide semiconductor thin film layer functions as a channel. The low resistance conductive thin films and the oxide semiconductor thin film layer are etched so that side surfaces of the resistance conductive thin films and corresponding side surfaces of the oxide semiconductor thin film layer coincide with each other in a channel width direction of the channel. A gate electrode is mounted over the oxide semiconductor thin film layer.
申请公布号 US7981734(B2) 申请公布日期 2011.07.19
申请号 US20090499559 申请日期 2009.07.08
申请人 KOCHI INDUSTRIAL PROMOTION CENTER;CASIO COMPUTER CO., LTD. 发明人 FURUTA MAMORU;HIRAO TAKASHI;FURUTA HIROSHI;MATSUDA TOKIYOSHI;HIRAMATSU TAKAHIRO;ISHII HIROMITSU;HOKARI HITOSHI;YOSHIDA MOTOHIKO
分类号 H01L21/302 主分类号 H01L21/302
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