发明名称 |
SENSOR DYNAMICALLY DETECTING BREAKAGE OF SUBSTRATE AND SHIFT OF SUBSTRATE BEING MOVED |
摘要 |
PROBLEM TO BE SOLVED: To detect a shift and/or breakage of a substrate at relatively reduced cost by decreasing the number of sensors required for the detection. SOLUTION: This invention relates to a method and a device with at least two incorporated sensors 140A and 140B which detect a defect, such as the breakage and the shift of the substrate 106 caused along lengths of at least two parallel ends of the substrate 106 being moved. In an embodiment, a device includes a sensor configuration which senses the substrate nearby at least the two parallel ends for detecting the defect of the substrate. In another embodiment, the device includes a robot 114 or 130 having a substrate support surface and the sensor configuration which senses the substrate nearby at least the two parallel ends for detecting the defect of the substrate. COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011139074(A) |
申请公布日期 |
2011.07.14 |
申请号 |
JP20110002531 |
申请日期 |
2011.01.07 |
申请人 |
APPLIED MATERIALS INC |
发明人 |
BAGLEY WILLIAM A;LEE PAOHUEI;KIM KYUNG-TAE;KIM SAM-KYUNG;KIYOTAKE TOSHIO;KIM SAM;MATSUMOTO TAKAYUKI;LARSON JONATHAN ERIK;INAGAWA MAKOTO;HOFFMAN JAMES;LEUNG BILLY C |
分类号 |
H01L21/68;B65G49/06;G01B11/00;G01B11/30;G01N21/89;G01N21/956 |
主分类号 |
H01L21/68 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|