发明名称 SENSOR DYNAMICALLY DETECTING BREAKAGE OF SUBSTRATE AND SHIFT OF SUBSTRATE BEING MOVED
摘要 PROBLEM TO BE SOLVED: To detect a shift and/or breakage of a substrate at relatively reduced cost by decreasing the number of sensors required for the detection. SOLUTION: This invention relates to a method and a device with at least two incorporated sensors 140A and 140B which detect a defect, such as the breakage and the shift of the substrate 106 caused along lengths of at least two parallel ends of the substrate 106 being moved. In an embodiment, a device includes a sensor configuration which senses the substrate nearby at least the two parallel ends for detecting the defect of the substrate. In another embodiment, the device includes a robot 114 or 130 having a substrate support surface and the sensor configuration which senses the substrate nearby at least the two parallel ends for detecting the defect of the substrate. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011139074(A) 申请公布日期 2011.07.14
申请号 JP20110002531 申请日期 2011.01.07
申请人 APPLIED MATERIALS INC 发明人 BAGLEY WILLIAM A;LEE PAOHUEI;KIM KYUNG-TAE;KIM SAM-KYUNG;KIYOTAKE TOSHIO;KIM SAM;MATSUMOTO TAKAYUKI;LARSON JONATHAN ERIK;INAGAWA MAKOTO;HOFFMAN JAMES;LEUNG BILLY C
分类号 H01L21/68;B65G49/06;G01B11/00;G01B11/30;G01N21/89;G01N21/956 主分类号 H01L21/68
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