发明名称 ETCHING METHOD AND PLASMA PROCESSING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide an etching method that controls the tapered shape of projections regardless of the shape of a resist film, and also to provide a plasma processing apparatus. <P>SOLUTION: The etching method is used to form projections 21a by etching on a sapphire substrate used in a semiconductor light-emitting element formed by providing semiconductor layers 22, 23, and 24 on the sapphire substrate 21 having the projections 21a. The sapphire substrate 21 having a resist film formed on the surface is etched by exciting a mixed gas, formed by adding a carbon-based gas to etching gas, into a plasma state while adjusting the flow rate of the carbon-based gas, thereby adjusting the tapered shape of the projections 21a. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011134800(A) 申请公布日期 2011.07.07
申请号 JP20090291221 申请日期 2009.12.22
申请人 SAMCO INC 发明人 NISHINOMIYA TOMOYASU;MARUNO ATSUNORI
分类号 H01L21/3065;H01L33/22 主分类号 H01L21/3065
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