发明名称 Phase change memory elements using self-aligned phase change material layers and methods of making and using the same
摘要 <p>A phase change memory element and method of forming the same. The memory element includes a substrate supporting a first electrode. An insulating material element is positioned over the first electrode, and a phase change material layer is formed over the first electrode and surrounding the insulating material element such that the phase change material layer has a lower surface that is in electrical communication with the first electrode. The memory element also has a second electrode in electrical communication with an upper surface of the phase change material layer. </p>
申请公布号 EP2325911(A3) 申请公布日期 2011.07.06
申请号 EP20110158140 申请日期 2007.03.23
申请人 MICRON TECHNOLOGY, INC. 发明人 LIU, JUN
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
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