发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING FLASH MEMORY, METHOD OF MANUFACTURING STATIC RANDOM ACCESS MEMORY, AND FLASH MEMORY |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device that is improved to prevent a modified resist surface layer from peeling when continuously performing dry etching and wet etching by the same resist pattern. SOLUTION: An insulation film 2 and a conductive layer 3 are sequentially formed on a semiconductor substrate 1. A resist pattern 4 is formed on the conductive layer 3. By using the resist pattern 4 for a mask, the conductive layer 3 is subjected to dry etching. A surface layer part of the resist pattern 4 is partially shaved. By using the resist pattern 4 for a mask, the insulation film 2 is subjected to wet etching. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2011129936(A) |
申请公布日期 |
2011.06.30 |
申请号 |
JP20110001124 |
申请日期 |
2011.01.06 |
申请人 |
RENESAS ELECTRONICS CORP;RENESAS SEMICONDUCTOR ENGINEERING CORP |
发明人 |
YUZURIHA KOJIRO;SHIMIZU HIDE;TANAKA TAMOTSU;YANO TAKASHI |
分类号 |
H01L21/8247;H01L21/027;H01L21/306;H01L21/3065;H01L21/8244;H01L27/11;H01L27/115;H01L29/788;H01L29/792 |
主分类号 |
H01L21/8247 |
代理机构 |
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代理人 |
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地址 |
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