发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE, METHOD OF MANUFACTURING FLASH MEMORY, METHOD OF MANUFACTURING STATIC RANDOM ACCESS MEMORY, AND FLASH MEMORY
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device that is improved to prevent a modified resist surface layer from peeling when continuously performing dry etching and wet etching by the same resist pattern. SOLUTION: An insulation film 2 and a conductive layer 3 are sequentially formed on a semiconductor substrate 1. A resist pattern 4 is formed on the conductive layer 3. By using the resist pattern 4 for a mask, the conductive layer 3 is subjected to dry etching. A surface layer part of the resist pattern 4 is partially shaved. By using the resist pattern 4 for a mask, the insulation film 2 is subjected to wet etching. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011129936(A) 申请公布日期 2011.06.30
申请号 JP20110001124 申请日期 2011.01.06
申请人 RENESAS ELECTRONICS CORP;RENESAS SEMICONDUCTOR ENGINEERING CORP 发明人 YUZURIHA KOJIRO;SHIMIZU HIDE;TANAKA TAMOTSU;YANO TAKASHI
分类号 H01L21/8247;H01L21/027;H01L21/306;H01L21/3065;H01L21/8244;H01L27/11;H01L27/115;H01L29/788;H01L29/792 主分类号 H01L21/8247
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