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发明名称
IC TESTER
摘要
申请公布号
KR101045036(B1)
申请公布日期
2011.06.30
申请号
KR20070055950
申请日期
2007.06.08
申请人
发明人
分类号
G01R31/26;G01R31/28;H01L21/66
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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