发明名称 Method and apparatus for simultaneous SEM and optical examination
摘要 Method and apparatus capable of observing a liquid sample. An optical image of the sample and an image using a primary beam, such as an electron beam or charged-particle beam, can be obtained at the same time. The apparatus has a film including a first surface on which the liquid sample is held. The primary beam irradiation column and optical image acquisition viewer are located on opposite sides of the film that acts to block light.
申请公布号 US7968843(B2) 申请公布日期 2011.06.28
申请号 US20090349195 申请日期 2009.01.06
申请人 JEOL LTD. 发明人 NISHIYAMA HIDETOSHI
分类号 H01J37/26 主分类号 H01J37/26
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