发明名称 |
MEASURING SYSTEM FOR DETERMINING SCATTER PARAMETERS |
摘要 |
<p>A measuring system for determining scatter parameters of an electrical measurement object on a substrate, having a measuring machine having at least one measuring channel and at least one measuring probe electrically connected to at least one measuring channel and designed for non-contacting or contacting connection to an electrical signal line of the electrical measurement in the electronic circuit. A first positioning device is provided for at least one measuring probe, wherein at least one sensor detects a position of at least one measuring probe and outputs a position signal.</p> |
申请公布号 |
KR20110070903(A) |
申请公布日期 |
2011.06.24 |
申请号 |
KR20117010844 |
申请日期 |
2009.09.29 |
申请人 |
ROSENBERGER HOCHFREQUENZTECHNIK GMBH & CO. KG |
发明人 |
ZELDER THOMAS;GECK BERND |
分类号 |
G01R31/28;G01R1/067;G01R27/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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