发明名称 NEGATIVE RESIST COMPOSITION AND PATTERNING PROCESS
摘要 There is disclosed a negative resist composition comprising at least: (A) a base polymer that is alkaline-soluble and is made alkaline-insoluble by action of an acid; (B) an acid generator; and (C) a basic component, wherein the base polymer at least contains a polymer including repeating units represented by the following general formula (1) and general formula (2) and having a weight average molecular weight of 1,000 to 10,000. There can be a negative resist composition hardly causing a bridge in forming a pattern and providing a high resolution and a patterning process using the same.
申请公布号 US2011143266(A1) 申请公布日期 2011.06.16
申请号 US20100911338 申请日期 2010.10.25
申请人 SHIN-ETSU CHEMICAL CO., LTD. 发明人 TANAKA AKINOBU;MASUNAGA KEIICHI;DOMON DAISUKE;WATANABE SATOSHI
分类号 G03F1/00;C08F212/04;C08F220/16;G03F7/004;G03F7/038;G03F7/20;H01L21/027 主分类号 G03F1/00
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