发明名称 Method and apparatus for describing and testing a system-on-chip
摘要 The present invention provides a new hardware description language for chip-level JTAG testing. This new hardware description language, referred to as New BSDL (NSDL), enables testing resources of a system-on-chip to be described, thereby enabling the system-on-chip to be described in a manner that facilitates testing of the system-on-chip. The present invention provides a bottom-up approach to describing a system-on-chip. The present invention supports algorithmic descriptions of each of the components of the system-on-chip, and supports an algorithmic description of interconnections between the components of the system-on-chip, thereby enabling generation of an algorithmic description of the entire system-on-chip or portions of the system-on-chip.
申请公布号 US7958479(B2) 申请公布日期 2011.06.07
申请号 US20070950138 申请日期 2007.12.04
申请人 ALCATEL-LUCENT USA INC. 发明人 CHAKRABORTY TAPAN J.;CHIANG CHEN-HUAN;GOYAL SURESH;PORTOLAN MICHELE;VAN TREUREN BRADFORD GENE
分类号 G06F17/50 主分类号 G06F17/50
代理机构 代理人
主权项
地址