发明名称 |
INDIRECT BONDING WITH DISAPPEARANCE OF BONDING LAYER |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of forming an SeOI structure of a semiconductor material which cannot be bonded directly to a support substrate. SOLUTION: The method includes the steps of using a semiconductor donor substrate comprising a lower layer 1 and an upper layer 2 and forming on the upper layer 2 a bonding layer 3 of a material that accepts diffusion of an element of the material of the upper layer 2; cleaning the bonding layer 3 for securing its bonding adhesion; bonding the donor substrate, from the side of the bonding layer 3 preformed on the upper layer 2 and cleaned, to the support substrate 20; and diffusing the element from the upper layer 2 into the bonding layer 3 and homogenize the concentration of the element in the bonding layer and the upper layer, to constitute a thin layer on a surface of the support substrate 20. COPYRIGHT: (C)2011,JPO&INPIT
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申请公布号 |
JP2011109125(A) |
申请公布日期 |
2011.06.02 |
申请号 |
JP20110005104 |
申请日期 |
2011.01.13 |
申请人 |
SOI TEC SILICON ON INSULATOR TECHNOLOGIES |
发明人 |
DAVAL NICOLAS;GHYSELEN BRUNO;AULNETTE CECILE;RAYSSAC OLIVIER;CAYREFOURCQ IAN |
分类号 |
H01L27/12;H01L21/02;H01L21/20;H01L21/265;H01L21/762 |
主分类号 |
H01L27/12 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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