发明名称 PLASMA PROCESSING APPARATUS
摘要 <P>PROBLEM TO BE SOLVED: To provide a plasma etching apparatus that achieves long-term stable performance by reducing the non-uniformity of the electric field in the outer peripheral part of a substrate to be processed by plasma. <P>SOLUTION: A plasma processing device has a focus ring provided on an electrode for placing a substrate to be processed thereon while surrounding the outer periphery of the substrate to be processed. The focus ring comprises: a first focus ring made of a conductor and provided on an electrostatic attraction film on the upper surface of the electrode for placing a substrate to be processed thereon; a second focus ring made of a dielectric and provided on the first focus ring; and a third focus ring made of a conductor and provided on the second focus ring. The first focus ring is provided so as to be in contact with plasma while having the upper-surface height almost equal to that of the substrate to be processed. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011108764(A) 申请公布日期 2011.06.02
申请号 JP20090260563 申请日期 2009.11.16
申请人 HITACHI HIGH-TECHNOLOGIES CORP 发明人 HIROMI KAZUYUKI;TAMURA SATOYUKI;YOKOGAWA KATANOBU;ICHINO TAKAMASA;NISHIO RYOJI
分类号 H01L21/3065;C23C14/34;C23C16/509;H01L21/205;H01L21/31;H05H1/46 主分类号 H01L21/3065
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