发明名称 |
PLASMA PROCESSING APPARATUS |
摘要 |
<P>PROBLEM TO BE SOLVED: To provide a plasma etching apparatus that achieves long-term stable performance by reducing the non-uniformity of the electric field in the outer peripheral part of a substrate to be processed by plasma. <P>SOLUTION: A plasma processing device has a focus ring provided on an electrode for placing a substrate to be processed thereon while surrounding the outer periphery of the substrate to be processed. The focus ring comprises: a first focus ring made of a conductor and provided on an electrostatic attraction film on the upper surface of the electrode for placing a substrate to be processed thereon; a second focus ring made of a dielectric and provided on the first focus ring; and a third focus ring made of a conductor and provided on the second focus ring. The first focus ring is provided so as to be in contact with plasma while having the upper-surface height almost equal to that of the substrate to be processed. <P>COPYRIGHT: (C)2011,JPO&INPIT |
申请公布号 |
JP2011108764(A) |
申请公布日期 |
2011.06.02 |
申请号 |
JP20090260563 |
申请日期 |
2009.11.16 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
HIROMI KAZUYUKI;TAMURA SATOYUKI;YOKOGAWA KATANOBU;ICHINO TAKAMASA;NISHIO RYOJI |
分类号 |
H01L21/3065;C23C14/34;C23C16/509;H01L21/205;H01L21/31;H05H1/46 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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