发明名称 |
INTEGRATED CIRCUITS AND METHODS FOR FORMING THE INTEGRATED CIRCUITS |
摘要 |
PURPOSE: An integrated circuit and a forming method thereof are provided to reduce a geometrical size by forming a metal layer at the same height as a first surface of an etching stop layer. CONSTITUTION: A gate electrode(103) is formed on a substrate(101). A first dielectric layer(109a) is formed on the gate electrode. An etching stop layer(111a) is formed on the first dielectric layer. An opening is formed through the first dielectric layer and the etching stop layer. A metal layer(150a,150b) in contact with a source/drain region(105a,105b) is formed in the opening. A damascene structure(170) is connected to the metal layer.
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申请公布号 |
KR20110051137(A) |
申请公布日期 |
2011.05.17 |
申请号 |
KR20100100989 |
申请日期 |
2010.10.15 |
申请人 |
TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. |
发明人 |
LIANG MING CHUNG;CHEN CHII PING |
分类号 |
H01L21/28 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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