发明名称 VERFAHREN ZUM AUFBRINGEN EINER ANTI- REFLEXIONSSCHICHT AUF EINEN SILIZIUM-WAFER
摘要 <p>The method involves covering main surface of the wafer in liquid tight manner, where the wafer is dipped into a reservoir, which has a solution based on anions of silicic acid or anions of a salt of the silica and doped-ions of an element of the fifth main group of the periodic table. The direct current is applied between wafer and another electrode at the uncovered another main surface of the wafer. An independent claim is also included for a silicon wafer.</p>
申请公布号 AT507586(T) 申请公布日期 2011.05.15
申请号 AT20090004431T 申请日期 2009.03.27
申请人 KIOTO PHOTOVOLTAICS GMBH 发明人 KROENER, FRIEDRICH
分类号 H01L31/18;H01L31/0216;H01L31/068 主分类号 H01L31/18
代理机构 代理人
主权项
地址