发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE, AND ARRAY OF SEMICONDUCTOR DEVICES
摘要 <P>PROBLEM TO BE SOLVED: To solve such a problem that, when a dicing mark is buried in a molding resin or the like, a dicing process is performed with reference to position information of the dicing mark read in advance or the like, however, the position data of the dicing mark may include a manufacturing error produced in each substrate manufacturing process to which the substrate is subjected before the dicing process, so that deterioration in dicing position accuracy is caused. <P>SOLUTION: A molding resin 61 is exposed from a recessed part 63x to form a dicing mark 63a, and a position of the recessed part 63x is observed in dicing. A manufacturing error produced in each substrate manufacturing process to which the substrate is subjected before the dicing process is corrected to perform the dicing. Since the recessed part 63x is made of a resin, a high contrast between a copper plate 1 surrounding the recessed part 63x and the recessed part 63x can be achieved, so that alignment accuracy can be improved furthermore. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011096882(A) 申请公布日期 2011.05.12
申请号 JP20090250074 申请日期 2009.10.30
申请人 SEIKO EPSON CORP 发明人 TOODA HISAYUKI;MISAWA NOBUYUKI;KURITA HIDEAKI
分类号 H01L23/12;H01L21/301 主分类号 H01L23/12
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