发明名称 OPTICAL-INTERFERENCE PATTERNING FOR RADIATION DETECTOR CRYSTALS
摘要 A radiation detector is disclosed that includes a scintillation crystal and a plurality of photodetectors positioned to detect low-energy scintillation photons generated within the scintillation crystal. The scintillation crystals are processed using subsurface laser engraving to generate point-like defects within the crystal to alter the path of the scintillation photons. In one embodiment, the defects define a plurality of boundaries within a monolithic crystal to delineate individual detector elements. In another embodiment, the defects define a depth- of -interaction boundary that varies longitudinally to vary the amount of light shared by neighboring portions of the crystal. In another embodiment the defects are evenly distributed to reduce the lateral spread of light from a scintillation event. Two or more of these different aspects may be combined in a single scintillation crystal. Additionally, or alternatively, similar SSLE defects may be produced in other light-guiding elements of the radiation detector.
申请公布号 WO2011056660(A2) 申请公布日期 2011.05.12
申请号 WO2010US54307 申请日期 2010.10.27
申请人 UNIVERSITY OF WASHINGTON THROUGH ITS CENTER FOR COMMERCIALIZATION;LEWELLEN, THOMAS, K.;HUNTER, WILLIAM, C., J.;MIYAOKA, ROBERT, S.;MACDONALD, LAWRENCE 发明人 LEWELLEN, THOMAS, K.;HUNTER, WILLIAM, C., J.;MIYAOKA, ROBERT, S.;MACDONALD, LAWRENCE
分类号 A61B6/12;G01T1/24 主分类号 A61B6/12
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