发明名称 COLOR-UNEVENNESS INSPECTION DEVICE AND COLOR-UNEVENNESS INSPECTION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a color-unevenness inspection device and a color-unevenness inspection method, capable of performing more appropriate color-unevenness inspection than ever before. <P>SOLUTION: An image processing part 21 specifies a color-unevenness region, classifies display pixels in the color-unevenness region into a plurality of color groups, and generates a color-unevenness image, in a pickup image (pickup data Din) to be inspected of a display screen of a display device 4. The image processing part 21 also calculates an evaluation parameter (surface ratio S and the maximum chroma Cmax) during color-unevenness inspection, regarding to the color-unevenness region of the color-unevenness image. A correction part 22 making a correction to the calculated evaluation parameter in consideration of a difference of color-unevenness visibility between the color groups. An inspection part 23 performs a color-unevenness inspection based on a resultant evaluation parameter (color-unevenness area ratio S' and the maximum chroma Cmax'). An objective color-unevenness inspection more matching feelings of human being than ever before is realized. <P>COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011095061(A) 申请公布日期 2011.05.12
申请号 JP20090248119 申请日期 2009.10.28
申请人 SONY CORP 发明人 NAGAMINE KUNIHIKO;TOMIOKA SATOSHI
分类号 G01M11/00;G01J3/50;G02F1/13 主分类号 G01M11/00
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