发明名称 |
THREE DIMENSIONAL SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
PURPOSE: A three dimensional semiconductor memory device and a method of fabricating the same are provided to prevent disturbance in reading data from a selected cell string by selectively applying voltage to ground selection lines. CONSTITUTION: In a three dimensional semiconductor memory device and a method of fabricating the same, an insulating layer(121) and a sacrificial layer pattern(131) are formed on a substrate(10). The substrate comprises a cell array area, a peripheral circuit area and a contact area. After the sacrificial layer pattern forms a sacrificing layer on the insulating layer, the sacrificing layer is patterned. A reserved separation pattern(20) is formed between sacrificial layer patterns. The reserved separation pattern is formed by the sacrificial layer pattern and an insulating material having etching selectivity. |
申请公布号 |
KR20110048719(A) |
申请公布日期 |
2011.05.12 |
申请号 |
KR20090105412 |
申请日期 |
2009.11.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HYUN, SUNG WOO;LEE, BYEONG CHAN;LEE, SUN GHIL |
分类号 |
H01L21/336;H01L21/027 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|