发明名称 Extreme ultra violet lithography mask and method for fabricating the same
摘要 A method for fabricating an extreme ultra violet lithography mask includes forming a reflective layer that reflects an extreme ultra violet light on a substrate; forming a capping layer that transmits the extreme ultra violet light on the reflective layer; and forming selectively pores in some region of the capping layer to form a light absorption region that absorbs the extreme ultra violet light.
申请公布号 US7939228(B2) 申请公布日期 2011.05.10
申请号 US20080165395 申请日期 2008.06.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM YONG DAE
分类号 G03F1/00 主分类号 G03F1/00
代理机构 代理人
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