发明名称 Double patterning strategy for contact hole and trench
摘要 A method of lithography patterning includes forming a first resist pattern on a substrate, the first resist pattern including at least one opening therein on the substrate; curing the first resist pattern; forming a second resist pattern on the substrate; forming a material layer on the substrate; and removing the first and second resist patterns to expose the substrate.
申请公布号 US7935477(B2) 申请公布日期 2011.05.03
申请号 US20070948444 申请日期 2007.11.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 HSU FENG-CHENG;CHEN CHUN-KUANG
分类号 G03F7/26 主分类号 G03F7/26
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