发明名称 METHOD OF ADJUSTING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of adjusting a semiconductor device capable of reducing power supply noises and noise themselves radiated as radio waves and eliminating power supply noises in the semiconductor device. SOLUTION: First, an adjusting-number count value CN is reset in 0 first, and then a noise specification value NST is set (S11). The adjusting-number count value CN is increased by one in S12. The noise peak value PK of power supply noises generated by the semiconductor device is acquired actually (S14), and whether the noise peak value PK1 is the noise specification value NST or less is decided (S16). A nondefective is decided when the noise peak value PK1 is the noise specification value NST or less (S19), and whether the adjusting-number count value CN is smaller than an adjusting-number upper-limit value CUL is decided when the noise peak value PK1 is the specification value NST or more (S16). A defective is decided when the noise peak value PK1 is the adjusting-number upper-limit value CUL or more (S20). The length of an open stub is shortened by a fixed length by a laser cut when the noise peak value PK1 is smaller than the adjusting-number upper-limit value CUL (S18). COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011087303(A) 申请公布日期 2011.04.28
申请号 JP20100243288 申请日期 2010.10.29
申请人 FUJITSU SEMICONDUCTOR LTD 发明人 ASANO SHIGETAKA
分类号 H01P1/203;H01L21/822;H01L27/04 主分类号 H01P1/203
代理机构 代理人
主权项
地址